![]() ![]() ![]() Power and ground pins have long been considered off limits to vectorless test because, by design, the power or ground pins are tied together, making an opening in a pin virtually undetectable in any of the currently available vectorless test solutions in the market. Simple graphical user interfaces are designed to maximize ease-of-use for operators in the fast-paced high-volume manufacturing environment.The Agilent Medalist i3070 includes another industry first - VTEP v2.0 vectorless test technology that incorporates the new Network Parameter Measurement technology targeted at defect detection on power and ground pins for connectors. For electronics manufacturers around the world, this system is the fastest, easiest way to bring the power of in-circuit test to the production line.Advanced algorithms provide analog test throughput increase by up to 50 percent compared with legacy Agilent Medalist 3070 systems. (NYSE: A) today announced the availability of the Agilent Medalist i3070 in-circuit test system for printed circuit board assembly. Agilent Technologies introduces Medalist i3070 in-circuit test system for PCBsĪgilent Medalist i3070 is Industry's Most Advanced, Flexible In-Circuit Test System for High-Complexity, High-Speed Printed Circuit Board Assemblies LOS ANGELES, APEX 2007, Feb. ![]()
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